Jong Hyun Park, Cheng-Ji Xian, Nak-Jin Seong, Soon-Gil Yoon, Seung-Hyun Son, Hyung-Mi Chung, Jin-Suck Moon, Hyun-Joo Jin, Seung Eun Lee, Jeong-Won Lee, Hyung-Dong Kang, Yeoul-Kyo Chung, Yong-Soo Oh. Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications. Microelectronics Reliability, 47(4-5):755-758, 2007. [doi]
@article{ParkXSYSCMJLLKCO07,
title = {Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications},
author = {Jong Hyun Park and Cheng-Ji Xian and Nak-Jin Seong and Soon-Gil Yoon and Seung-Hyun Son and Hyung-Mi Chung and Jin-Suck Moon and Hyun-Joo Jin and Seung Eun Lee and Jeong-Won Lee and Hyung-Dong Kang and Yeoul-Kyo Chung and Yong-Soo Oh},
year = {2007},
doi = {10.1016/j.microrel.2007.01.038},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.038},
tags = {rule-based},
researchr = {https://researchr.org/publication/ParkXSYSCMJLLKCO07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {4-5},
pages = {755-758},
}