Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates - researchr publication authors

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Dario Jeronimo Pasadas, Helena Maria Geirinhas Ramos, Bo Feng, Prashanth Baskaran, Artur Lopes Ribeiro. Defect Classification With SVM and Wideband Excitation in Multilayer Aluminum Plates. IEEE T. Instrumentation and Measurement, 69(1):241-248, 2020. [doi]

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