Fabian Paschke, Christian Bayer, Olaf Enge-Rosenblatt. A generic approach for detection of wear-out situations in machine subsystems. In 21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{PaschkeBE16,
title = {A generic approach for detection of wear-out situations in machine subsystems},
author = {Fabian Paschke and Christian Bayer and Olaf Enge-Rosenblatt},
year = {2016},
doi = {10.1109/ETFA.2016.7733700},
url = {http://dx.doi.org/10.1109/ETFA.2016.7733700},
researchr = {https://researchr.org/publication/PaschkeBE16},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016, Berlin, Germany, September 6-9, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1314-2},
}