Stefano Di Pascoli, Giuseppe Iannaccone. Noise and reliability in simulated thin metal films. Microelectronics Reliability, 48(7):1015-1020, 2008. [doi]
@article{PascoliI08,
title = {Noise and reliability in simulated thin metal films},
author = {Stefano Di Pascoli and Giuseppe Iannaccone},
year = {2008},
doi = {10.1016/j.microrel.2008.03.018},
url = {http://dx.doi.org/10.1016/j.microrel.2008.03.018},
tags = {reliability},
researchr = {https://researchr.org/publication/PascoliI08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {7},
pages = {1015-1020},
}