Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella. Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]. IEEE Transactions on Reliability, 45(4):531-540, 1996. [doi]
@article{PasquiniCM96,
title = {Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]},
author = {Alberto Pasquini and Adalberto Nobiato Crespo and Paolo Matrella},
year = {1996},
doi = {10.1109/24.556576},
url = {http://dx.doi.org/10.1109/24.556576},
researchr = {https://researchr.org/publication/PasquiniCM96},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {45},
number = {4},
pages = {531-540},
}