Automotive semiconductor test

Steve Pateras, Ting-Pu Tai. Automotive semiconductor test. In 2017 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2017, Hsinchu, Taiwan, April 24-27, 2017. pages 1-4, IEEE, 2017. [doi]

Authors

Steve Pateras

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Ting-Pu Tai

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