Multi-scale Modeling and Analysis of Nano-RFID Systems on HPC Setup

Rohit Pathak, Satyadhar Joshi. Multi-scale Modeling and Analysis of Nano-RFID Systems on HPC Setup. In Sanjay Ranka, Srinivas Aluru, Rajkumar Buyya, Yeh-Ching Chung, Sumeet Dua, Ananth Grama, Sandeep K. S. Gupta, Rajeev Kumar, Vir V. Phoha, editors, Contemporary Computing - Second International Conference, IC3 2009, Noida, India, August 17-19, 2009. Proceedings. Volume 40 of Communications in Computer and Information Science, pages 649-659, Springer, 2009. [doi]

@inproceedings{PathakJ09b,
  title = {Multi-scale Modeling and Analysis of Nano-RFID Systems on HPC Setup},
  author = {Rohit Pathak and Satyadhar Joshi},
  year = {2009},
  doi = {10.1007/978-3-642-03547-0_61},
  url = {http://dx.doi.org/10.1007/978-3-642-03547-0_61},
  tags = {modeling, analysis},
  researchr = {https://researchr.org/publication/PathakJ09b},
  cites = {0},
  citedby = {0},
  pages = {649-659},
  booktitle = {Contemporary Computing - Second International Conference, IC3 2009, Noida, India, August 17-19, 2009. Proceedings},
  editor = {Sanjay Ranka and Srinivas Aluru and Rajkumar Buyya and Yeh-Ching Chung and Sumeet Dua and Ananth Grama and Sandeep K. S. Gupta and Rajeev Kumar and Vir V. Phoha},
  volume = {40},
  series = {Communications in Computer and Information Science},
  publisher = {Springer},
  isbn = {978-3-642-03546-3},
}