Predictive modeling for corrective maintenance of imaging devices from machine logs

Ravindra B. Patil, Meru A. Patil, Vidya Ravi, Sarif Naik. Predictive modeling for corrective maintenance of imaging devices from machine logs. In 2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju Island, South Korea, July 11-15, 2017. pages 1676-1679, IEEE, 2017. [doi]

Authors

Ravindra B. Patil

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Meru A. Patil

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Vidya Ravi

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Sarif Naik

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