Piotr Patronik. Delay Testability Properties of Circuits Implementing Threshold and Symmetric Functions. In Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal. pages 289-297, IEEE Computer Society, 2005. [doi]
@inproceedings{Patronik05, title = {Delay Testability Properties of Circuits Implementing Threshold and Symmetric Functions}, author = {Piotr Patronik}, year = {2005}, doi = {10.1109/DSD.2005.31}, url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2005.31}, tags = {testing}, researchr = {https://researchr.org/publication/Patronik05}, cites = {0}, citedby = {0}, pages = {289-297}, booktitle = {Eighth Euromicro Symposium on Digital Systems Design (DSD 2005), 30 August - 3 September 2005, Porto, Portugal}, publisher = {IEEE Computer Society}, isbn = {0-7695-2433-8}, }