pk

Wen Lea Pearn, J.-J. H. Shiau, Y. T. Tai, M. Y. Li. pk. Quality and Reliability Eng. Int., 27(8):1119-1129, 2011. [doi]

Authors

Wen Lea Pearn

This author has not been identified. Look up 'Wen Lea Pearn' in Google

J.-J. H. Shiau

This author has not been identified. Look up 'J.-J. H. Shiau' in Google

Y. T. Tai

This author has not been identified. Look up 'Y. T. Tai' in Google

M. Y. Li

This author has not been identified. Look up 'M. Y. Li' in Google