Huan-Kai Peng, Hsuan-Ming Huang, Yu-Hsin Kuo, Charles H.-P. Wen. Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs. ACM Trans. Design Autom. Electr. Syst., 17(1):9, 2012. [doi]
@article{PengHKW12,
title = {Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs},
author = {Huan-Kai Peng and Hsuan-Ming Huang and Yu-Hsin Kuo and Charles H.-P. Wen},
year = {2012},
doi = {10.1145/2071356.2071365},
url = {http://doi.acm.org/10.1145/2071356.2071365},
researchr = {https://researchr.org/publication/PengHKW12},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {17},
number = {1},
pages = {9},
}