Bo-Wei Peng, Chun-Yu Lin. Low-Loss I/O Pad With ESD Protection for K/Ka-Bands Applications in the Nanoscale CMOS Process. IEEE Trans. on Circuits and Systems, 65(10):1475-1479, 2018. [doi]
@article{PengL18-5,
title = {Low-Loss I/O Pad With ESD Protection for K/Ka-Bands Applications in the Nanoscale CMOS Process},
author = {Bo-Wei Peng and Chun-Yu Lin},
year = {2018},
doi = {10.1109/TCSII.2018.2857403},
url = {https://doi.org/10.1109/TCSII.2018.2857403},
researchr = {https://researchr.org/publication/PengL18-5},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {65},
number = {10},
pages = {1475-1479},
}