A Random Extension for Discriminative Dimensionality Reduction and Metric Learning - researchr publication authors

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Adrian Perez-Suay, Francesc J. Ferri, Jesús V. Albert. A Random Extension for Discriminative Dimensionality Reduction and Metric Learning. In Helder Araújo, Ana Maria Mendonça, Armando J. Pinho, M. Inés Torres, editors, Pattern Recognition and Image Analysis, 4th Iberian Conference, IbPRIA 2009, Póvoa de Varzim, Portugal, June 10-12, 2009, Proceedings. Volume 5524 of Lecture Notes in Computer Science, pages 370-377, Springer, 2009. [doi]

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