An Online Metric Learning Approach through Margin Maximization

Adrian Perez-Suay, Francesc J. Ferri, Jesús V. Albert. An Online Metric Learning Approach through Margin Maximization. In Jordi Vitrià, João Miguel Raposo Sanches, Mario Hernández, editors, Pattern Recognition and Image Analysis - 5th Iberian Conference, IbPRIA 2011, Las Palmas de Gran Canaria, Spain, June 8-10, 2011. Proceedings. Volume 6669 of Lecture Notes in Computer Science, pages 500-507, Springer, 2011. [doi]

@inproceedings{Perez-SuayFA11,
  title = {An Online Metric Learning Approach through Margin Maximization},
  author = {Adrian Perez-Suay and Francesc J. Ferri and Jesús V. Albert},
  year = {2011},
  doi = {10.1007/978-3-642-21257-4_62},
  url = {http://dx.doi.org/10.1007/978-3-642-21257-4_62},
  tags = {systematic-approach},
  researchr = {https://researchr.org/publication/Perez-SuayFA11},
  cites = {0},
  citedby = {0},
  pages = {500-507},
  booktitle = {Pattern Recognition and Image Analysis - 5th Iberian Conference, IbPRIA 2011, Las Palmas de Gran Canaria, Spain, June 8-10, 2011. Proceedings},
  editor = {Jordi Vitrià and João Miguel Raposo Sanches and Mario Hernández},
  volume = {6669},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-21256-7},
}