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Betrayed by Light: How Photon Emission Microscopy Empowers Register Bit-Level Laser Attacks on Microcontrollers

Hugo Perrin, Jean-Max Dutertre, Jean-Baptiste Rigaud. Betrayed by Light: How Photon Emission Microscopy Empowers Register Bit-Level Laser Attacks on Microcontrollers. In IEEE International Symposium on Hardware Oriented Security and Trust, HOST 2025, San Jose, CA, USA, May 5-8, 2025. pages 35-45, IEEE, 2025. [doi]

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Hugo Perrin

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Jean-Max Dutertre

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Jean-Baptiste Rigaud

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