Jani Pesonen, Mika Katara, Tommi Mikkonen. Production-Testing of Embedded Systems with Aspects. In Shmuel Ur, Eyal Bin, Yaron Wolfsthal, editors, Hardware and Software Verification and Testing, First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers. Volume 3875 of Lecture Notes in Computer Science, pages 90-102, Springer, 2005. [doi]
@inproceedings{PesonenKM05,
title = {Production-Testing of Embedded Systems with Aspects},
author = {Jani Pesonen and Mika Katara and Tommi Mikkonen},
year = {2005},
doi = {10.1007/11678779_7},
url = {http://dx.doi.org/10.1007/11678779_7},
tags = {testing},
researchr = {https://researchr.org/publication/PesonenKM05},
cites = {0},
citedby = {0},
pages = {90-102},
booktitle = {Hardware and Software Verification and Testing, First International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005, Revised Selected Papers},
editor = {Shmuel Ur and Eyal Bin and Yaron Wolfsthal},
volume = {3875},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-32604-9},
}