Oscillation-Based Test Applied to a Wideband CCII

Pablo A. Petrashin, Luis E. Toledo, Walter J. Lancioni, Piotr J. Osuch, Tinus Stander. Oscillation-Based Test Applied to a Wideband CCII. VLSI Design, 2017, 2017. [doi]

Authors

Pablo A. Petrashin

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Luis E. Toledo

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Walter J. Lancioni

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Piotr J. Osuch

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Tinus Stander

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