Measuring precision for static and dynamic design pattern recognition as a function of coverage

Niklas Pettersson. Measuring precision for static and dynamic design pattern recognition as a function of coverage. ACM SIGSOFT Software Engineering Notes, 30(4):1-7, 2005. [doi]

@article{Pettersson05,
  title = {Measuring precision for static and dynamic design pattern recognition as a function of coverage},
  author = {Niklas Pettersson},
  year = {2005},
  doi = {10.1145/1082983.1083253},
  url = {http://doi.acm.org/10.1145/1082983.1083253},
  tags = {design, coverage},
  researchr = {https://researchr.org/publication/Pettersson05},
  cites = {0},
  citedby = {0},
  journal = {ACM SIGSOFT Software Engineering Notes},
  volume = {30},
  number = {4},
  pages = {1-7},
}