Dustin F. Pieper, Kristen M. Donnell. Application of frequency selective surfaces for inspection of layered structures. In 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015. pages 1204-1209, IEEE, 2015. [doi]
@inproceedings{PieperD15,
title = {Application of frequency selective surfaces for inspection of layered structures},
author = {Dustin F. Pieper and Kristen M. Donnell},
year = {2015},
doi = {10.1109/I2MTC.2015.7151444},
url = {https://doi.org/10.1109/I2MTC.2015.7151444},
researchr = {https://researchr.org/publication/PieperD15},
cites = {0},
citedby = {0},
pages = {1204-1209},
booktitle = {2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, Pisa, Italy, May 11-14, 2015},
publisher = {IEEE},
isbn = {978-1-4799-6114-6},
}