Stefan Pitzek, Peter P. Puschner. Function Test Environment for Embedded Driver Components. In 7th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing (ISORC 2004), 12-14 May 2004, Vienna, Austria. pages 237-244, IEEE Computer Society, 2004. [doi]
@inproceedings{PitzekP04,
title = {Function Test Environment for Embedded Driver Components},
author = {Stefan Pitzek and Peter P. Puschner},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/isorc/2004/2124/00/21240237abs.htm},
tags = {meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/PitzekP04},
cites = {0},
citedby = {0},
pages = {237-244},
booktitle = {7th IEEE International Symposium on Object-Oriented Real-Time Distributed Computing (ISORC 2004), 12-14 May 2004, Vienna, Austria},
publisher = {IEEE Computer Society},
isbn = {0-7695-2124-X},
}