Ilia Polian. Test and Reliability Challenges for Approximate Circuitry. Embedded Systems Letters, 10(1):26-29, 2018. [doi]
@article{Polian18,
title = {Test and Reliability Challenges for Approximate Circuitry},
author = {Ilia Polian},
year = {2018},
doi = {10.1109/LES.2017.2754446},
url = {https://doi.org/10.1109/LES.2017.2754446},
researchr = {https://researchr.org/publication/Polian18},
cites = {0},
citedby = {0},
journal = {Embedded Systems Letters},
volume = {10},
number = {1},
pages = {26-29},
}