Julian W. Post, A. Bhattacharyya. Saline soak tests to determine the short-term reliability of an in situ thin film resistance temperature detector. Microelectronics Reliability, 48(10):1673-1682, 2008. [doi]
@article{PostB08,
title = {Saline soak tests to determine the short-term reliability of an in situ thin film resistance temperature detector},
author = {Julian W. Post and A. Bhattacharyya},
year = {2008},
doi = {10.1016/j.microrel.2008.05.002},
url = {http://dx.doi.org/10.1016/j.microrel.2008.05.002},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/PostB08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {10},
pages = {1673-1682},
}