Design of an Adaptive Scanning Optical Microscope for Simultaneous Large Field of View and High Resolution

Benjamin Potsaid, Yves Bellouard, John T. Wen. Design of an Adaptive Scanning Optical Microscope for Simultaneous Large Field of View and High Resolution. In Proceedings of the 2005 IEEE International Conference on Robotics and Automation, ICRA 2005, April 18-22, 2005, Barcelona, Spain. pages 460-465, IEEE, 2005.

Authors

Benjamin Potsaid

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Yves Bellouard

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John T. Wen

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