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Overview of the 2nd International Competition on Plagiarism Detection

Martin Potthast, Alberto Barrón-Cedeño, Andreas Eiselt, Benno Stein, Paolo Rosso. Overview of the 2nd International Competition on Plagiarism Detection. In Martin Braschler, Donna Harman, Emanuele Pianta, editors, CLEF 2010 LABs and Workshops, Notebook Papers, 22-23 September 2010, Padua, Italy. 2010. [doi]

Authors

Martin Potthast

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Alberto Barrón-Cedeño

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Andreas Eiselt

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Benno Stein

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Paolo Rosso

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