Peyman Pouyan, Esteve Amat, Antonio Rubio. Monitoring SRAM BTI degradation by current-based tracking technique. In 14th IEEE International New Circuits and Systems Conference, NEWCAS 2016, Vancouver, BC, Canada, June 26-29, 2016. pages 1-4, IEEE, 2016. [doi]
@inproceedings{PouyanAR16, title = {Monitoring SRAM BTI degradation by current-based tracking technique}, author = {Peyman Pouyan and Esteve Amat and Antonio Rubio}, year = {2016}, doi = {10.1109/NEWCAS.2016.7604766}, url = {http://dx.doi.org/10.1109/NEWCAS.2016.7604766}, researchr = {https://researchr.org/publication/PouyanAR16}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {14th IEEE International New Circuits and Systems Conference, NEWCAS 2016, Vancouver, BC, Canada, June 26-29, 2016}, publisher = {IEEE}, isbn = {978-1-4673-8900-6}, }