John D. Powell. Determining Defect Trends and Identifying Critical Discriminators: A Case Study. In 10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA. IEEE Computer Society, 2004.
@inproceedings{Powell04:1,
title = {Determining Defect Trends and Identifying Critical Discriminators: A Case Study},
author = {John D. Powell},
year = {2004},
tags = {case study},
researchr = {https://researchr.org/publication/Powell04%3A1},
cites = {0},
citedby = {0},
booktitle = {10th IEEE International Software Metrics Symposium (METRICS 2004), 11-17 September 2004, Chicago, IL, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2129-0},
}