Alexander C. Probst, Martin Braun, Jurgen Backes, Stefan Tenbohlen. Probabilistic analysis of voltage bands stressed by electric mobility. In 2nd IEEE PES International Conference and Exhibition on "Innovative Smart Grid Technologies", ISGT Europe 2011, Manchester, United Kingdom, December 5-7, 2011. pages 1-8, IEEE, 2011. [doi]
@inproceedings{ProbstBBT11,
title = {Probabilistic analysis of voltage bands stressed by electric mobility},
author = {Alexander C. Probst and Martin Braun and Jurgen Backes and Stefan Tenbohlen},
year = {2011},
doi = {10.1109/ISGTEurope.2011.6162773},
url = {http://dx.doi.org/10.1109/ISGTEurope.2011.6162773},
researchr = {https://researchr.org/publication/ProbstBBT11},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2nd IEEE PES International Conference and Exhibition on "Innovative Smart Grid Technologies", ISGT Europe 2011, Manchester, United Kingdom, December 5-7, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1422-1},
}