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Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

A. Pugatschow, R. Heiderhoff, L. J. Balk. Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations. Microelectronics Reliability, 47(9-11):1529-1533, 2007. [doi]

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