Charge Trapping Control in MOS Capacitors - researchr publication authors

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Manuel Domínguez Pumar, Chenna Reddy Bheesayagari, Sergi Gorreta, Gema Lopez-Rodriguez, Isidro Martin, Elena Blokhina, Joan Pons-Nin. Charge Trapping Control in MOS Capacitors. IEEE Transactions on Industrial Electronics, 64(4):3023-3029, 2017. [doi]

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