Conjunctive Radar and Laser Altimetry Data Processing to Measure Snow Thickness - researchr publication authors

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Deepthi Puthalapat, Carl Leuschen, Thorsten Markus, Donald J. Cavalieri, William Krabill, John Sonntag, Mathew Sturm, James Maslanik. Conjunctive Radar and Laser Altimetry Data Processing to Measure Snow Thickness. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings. pages 11051108, IEEE, 2008. [doi]

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