Certified Hardness vs. Randomness for Log-Space

Edward Pyne, Ran Raz, Wei Zhan. Certified Hardness vs. Randomness for Log-Space. In 64th IEEE Annual Symposium on Foundations of Computer Science, FOCS 2023, Santa Cruz, CA, USA, November 6-9, 2023. pages 989-1007, IEEE, 2023. [doi]

Authors

Edward Pyne

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Ran Raz

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Wei Zhan

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