TASEP model with a single defect coupling on-ramp

Lin Qi, Song Xiao, Xiaoling Cui. TASEP model with a single defect coupling on-ramp. In 3rd International Conference on Artificial Intelligence and Advanced Manufacture, AIAM 2021, Manchester, United Kingdom, October 23-25, 2021. pages 83-88, IEEE, 2021. [doi]

@inproceedings{QiXC21,
  title = {TASEP model with a single defect coupling on-ramp},
  author = {Lin Qi and Song Xiao and Xiaoling Cui},
  year = {2021},
  doi = {10.1109/AIAM54119.2021.00025},
  url = {https://doi.org/10.1109/AIAM54119.2021.00025},
  researchr = {https://researchr.org/publication/QiXC21},
  cites = {0},
  citedby = {0},
  pages = {83-88},
  booktitle = {3rd International Conference on Artificial Intelligence and Advanced Manufacture, AIAM 2021, Manchester, United Kingdom, October 23-25, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-1732-7},
}