Xi Qian, Adit D. Singh. Distinguishing Resistive Small Delay Defects from Random Parameter Variations. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 325-330, IEEE Computer Society, 2010. [doi]
@inproceedings{QianS10-0, title = {Distinguishing Resistive Small Delay Defects from Random Parameter Variations}, author = {Xi Qian and Adit D. Singh}, year = {2010}, doi = {10.1109/ATS.2010.62}, url = {http://dx.doi.org/10.1109/ATS.2010.62}, researchr = {https://researchr.org/publication/QianS10-0}, cites = {0}, citedby = {0}, pages = {325-330}, booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China}, publisher = {IEEE Computer Society}, isbn = {978-0-7695-4248-5}, }