Zhidong Qin, Hui Chen, Youqun Shi. Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software. In Shuvra S. Bhattacharyya, Xingshe Zhou, Bing Guo, Zili Shao, Xiangke Liao, editors, International Conference on Embedded Software and Systems, ICESS '08, Chengdu, Sichuan, China, July 29-31, 2008. pages 481-487, IEEE, 2008. [doi]
@inproceedings{QinCS08,
title = {Reliability Demonstration Testing Method for Safety-Critical Embedded Applications Software},
author = {Zhidong Qin and Hui Chen and Youqun Shi},
year = {2008},
doi = {10.1109/ICESS.2008.76},
url = {http://doi.ieeecomputersociety.org/10.1109/ICESS.2008.76},
researchr = {https://researchr.org/publication/QinCS08},
cites = {0},
citedby = {0},
pages = {481-487},
booktitle = {International Conference on Embedded Software and Systems, ICESS '08, Chengdu, Sichuan, China, July 29-31, 2008},
editor = {Shuvra S. Bhattacharyya and Xingshe Zhou and Bing Guo and Zili Shao and Xiangke Liao},
publisher = {IEEE},
isbn = {978-0-7695-3287-5},
}