A. K. M. Shahariar Azad Rabby, Md. Majedul Islam, Nazmul Hasan, Jebun Nahar, Fuad Rahman. A Novel Deep Learning Character-Level Solution to Detect Language and Printing Style from a Bilingual Scanned Document. In Xintao Wu, Chris Jermaine, Li Xiong 0001, Xiaohua Hu 0001, Olivera Kotevska, Siyuan Lu, Weija Xu, Srinivas Aluru, ChengXiang Zhai, Eyhab Al-Masri, Zhiyuan Chen 0003, Jeff Saltz 0001, editors, IEEE International Conference on Big Data, Big Data 2020, Atlanta, GA, USA, December 10-13, 2020. pages 5218-5226, IEEE, 2020. [doi]
@inproceedings{RabbyIHNR20-0,
title = {A Novel Deep Learning Character-Level Solution to Detect Language and Printing Style from a Bilingual Scanned Document},
author = {A. K. M. Shahariar Azad Rabby and Md. Majedul Islam and Nazmul Hasan and Jebun Nahar and Fuad Rahman},
year = {2020},
doi = {10.1109/BigData50022.2020.9378262},
url = {https://doi.org/10.1109/BigData50022.2020.9378262},
researchr = {https://researchr.org/publication/RabbyIHNR20-0},
cites = {0},
citedby = {0},
pages = {5218-5226},
booktitle = {IEEE International Conference on Big Data, Big Data 2020, Atlanta, GA, USA, December 10-13, 2020},
editor = {Xintao Wu and Chris Jermaine and Li Xiong 0001 and Xiaohua Hu 0001 and Olivera Kotevska and Siyuan Lu and Weija Xu and Srinivas Aluru and ChengXiang Zhai and Eyhab Al-Masri and Zhiyuan Chen 0003 and Jeff Saltz 0001},
publisher = {IEEE},
isbn = {978-1-7281-6251-5},
}