Marcin Radlak, Ryszard Klempous. SELDI-TOF-MS Pattern Analysis for Cancer Detection as a Base for Diagnostic Software. In Alexander F. Gelbukh, Angel Fernando Kuri Morales, editors, MICAI 2007: Advances in Artificial Intelligence, 6th Mexican International Conference on Artificial Intelligence, Aguascalientes, Mexico, November 4-10, 2007, Proceedings. Volume 4827 of Lecture Notes in Computer Science, pages 1132-1142, Springer, 2007. [doi]
@inproceedings{RadlakK07,
title = {SELDI-TOF-MS Pattern Analysis for Cancer Detection as a Base for Diagnostic Software},
author = {Marcin Radlak and Ryszard Klempous},
year = {2007},
doi = {10.1007/978-3-540-76631-5_108},
url = {http://dx.doi.org/10.1007/978-3-540-76631-5_108},
tags = {rule-based, model-based diagnostics, meta-model, analysis, diagnostics, Meta-Environment},
researchr = {https://researchr.org/publication/RadlakK07},
cites = {0},
citedby = {0},
pages = {1132-1142},
booktitle = {MICAI 2007: Advances in Artificial Intelligence, 6th Mexican International Conference on Artificial Intelligence, Aguascalientes, Mexico, November 4-10, 2007, Proceedings},
editor = {Alexander F. Gelbukh and Angel Fernando Kuri Morales},
volume = {4827},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-540-76630-8},
}