In-Line Wood Defect Detection Using Simple Scalar Network Analyzer

Mohamed Radwan, Noah Becker, David Victor Thiel, Hugo G. Espinosa. In-Line Wood Defect Detection Using Simple Scalar Network Analyzer. Sensors, 22(23):9495, 2022. [doi]

Authors

Mohamed Radwan

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Noah Becker

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David Victor Thiel

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Hugo G. Espinosa

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