Bayesian quickest change process detection

Vasanthan Raghavan, Venugopal V. Veeravalli. Bayesian quickest change process detection. In IEEE International Symposium on Information Theory, ISIT 2009, June 28 - July 3, 2009, Seoul, Korea, Proceedings. pages 644-648, IEEE, 2009. [doi]

Authors

Vasanthan Raghavan

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Venugopal V. Veeravalli

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