Estimating Surface Characteristics using Physical Reflectance Models

Hossein Ragheb, Edwin R. Hancock. Estimating Surface Characteristics using Physical Reflectance Models. In 2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2003), 16-22 June 2003, Madison, WI, USA. pages 177-184, IEEE Computer Society, 2003. [doi]

@inproceedings{RaghebH03:0,
  title = {Estimating Surface Characteristics using Physical Reflectance Models},
  author = {Hossein Ragheb and Edwin R. Hancock},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/cvpr/2003/1900/02/190020177abs.htm},
  researchr = {https://researchr.org/publication/RaghebH03%3A0},
  cites = {0},
  citedby = {0},
  pages = {177-184},
  booktitle = {2003 IEEE Computer Society Conference on  Computer Vision and Pattern Recognition (CVPR 2003), 16-22 June 2003, Madison, WI, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1900-8},
}