Hossein Ragheb, Edwin R. Hancock. Estimating Surface Characteristics using Physical Reflectance Models. In 2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2003), 16-22 June 2003, Madison, WI, USA. pages 177-184, IEEE Computer Society, 2003. [doi]
@inproceedings{RaghebH03:0, title = {Estimating Surface Characteristics using Physical Reflectance Models}, author = {Hossein Ragheb and Edwin R. Hancock}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/cvpr/2003/1900/02/190020177abs.htm}, researchr = {https://researchr.org/publication/RaghebH03%3A0}, cites = {0}, citedby = {0}, pages = {177-184}, booktitle = {2003 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2003), 16-22 June 2003, Madison, WI, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1900-8}, }