Mohammed Saif ur Rahman, Mohamed A. Abou-Khousa. Millimeter Wave Imaging of Surface Defects and Corrosion under Paint using V-band Reflectometer. In 2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019, Abu Dhabi, United Arab Emirates, December 9-10, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{RahmanA19-4,
title = {Millimeter Wave Imaging of Surface Defects and Corrosion under Paint using V-band Reflectometer},
author = {Mohammed Saif ur Rahman and Mohamed A. Abou-Khousa},
year = {2019},
doi = {10.1109/IST48021.2019.9010500},
url = {https://doi.org/10.1109/IST48021.2019.9010500},
researchr = {https://researchr.org/publication/RahmanA19-4},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2019 IEEE International Conference on Imaging Systems and Techniques, IST 2019, Abu Dhabi, United Arab Emirates, December 9-10, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3868-8},
}