A Node-Embedding Features Based Machine Learning Technique for Dynamic Malware Detection

Sudhir Kumar Rai, Ashish Mittal, Sparsh Mittal. A Node-Embedding Features Based Machine Learning Technique for Dynamic Malware Detection. In IEEE Conference on Dependable and Secure Computing, DSC 2022, Edinburgh, UK, June 22-24, 2022. pages 1-8, IEEE, 2022. [doi]

Authors

Sudhir Kumar Rai

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Ashish Mittal

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Sparsh Mittal

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