Single event upset immune latch circuit design using C-element

Ramin Rajaei, Mahmoud Tabandeh, Bizhan Rashidian. Single event upset immune latch circuit design using C-element. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 252-255, IEEE, 2011. [doi]

Authors

Ramin Rajaei

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Mahmoud Tabandeh

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Bizhan Rashidian

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