P. Rajendiran, R. Srinivasan. Heavy ion impact on narrow band cascoded low noise amplifier. Microelectronics Reliability, 91:31-37, 2018. [doi]
@article{RajendiranS18,
title = {Heavy ion impact on narrow band cascoded low noise amplifier},
author = {P. Rajendiran and R. Srinivasan},
year = {2018},
doi = {10.1016/j.microrel.2018.08.001},
url = {https://doi.org/10.1016/j.microrel.2018.08.001},
researchr = {https://researchr.org/publication/RajendiranS18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {91},
pages = {31-37},
}