Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment

Mohsen Raji, Reza Mahmoudi, Behnam Ghavami, Saeed Keshavarzi. Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment. IEEE Access, 9:114120-114134, 2021. [doi]

Authors

Mohsen Raji

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Reza Mahmoudi

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Behnam Ghavami

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Saeed Keshavarzi

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