Mohsen Raji, Hossein Pedram, Behnam Ghavami. A practical metric for soft error vulnerability analysis of combinational circuits. Microelectronics Reliability, 55(2):448-460, 2015. [doi]
@article{RajiPG15,
title = {A practical metric for soft error vulnerability analysis of combinational circuits},
author = {Mohsen Raji and Hossein Pedram and Behnam Ghavami},
year = {2015},
doi = {10.1016/j.microrel.2014.11.004},
url = {http://dx.doi.org/10.1016/j.microrel.2014.11.004},
researchr = {https://researchr.org/publication/RajiPG15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {2},
pages = {448-460},
}