Mohsen Raji, M. Amin Sabet, Behnam Ghavami. Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme. IEEE Access, 7:66485-66495, 2019. [doi]
@article{RajiSG19,
title = {Soft Error Reliability Improvement of Digital Circuits by Exploiting a Fast Gate Sizing Scheme},
author = {Mohsen Raji and M. Amin Sabet and Behnam Ghavami},
year = {2019},
doi = {10.1109/ACCESS.2019.2902505},
url = {https://doi.org/10.1109/ACCESS.2019.2902505},
researchr = {https://researchr.org/publication/RajiSG19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {66485-66495},
}