G. K. Rajput, R. K. Agrawal. Evaluation of Feature Selection Measures for Steganalysis. In Santanu Chaudhury, Sushmita Mitra, C. A. Murthy, P. S. Sastry, Sankar K. Pal, editors, Pattern Recognition and Machine Intelligence, Third International Conference, PReMI 2009, New Delhi, India, December 16-20, 2009 Proceedings. Volume 5909 of Lecture Notes in Computer Science, pages 432-439, Springer, 2009. [doi]
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