Hannes Ramon, Joris Lambrecht, Jochem Verbist, Michael Vanhoecke, Srinivasan Ashwyn Srinivasan, Peter De Heyn, Joris Van Campenhout, Peter Ossieur, Xin Yin, Johan Bauwelinck. 70 Gb/s 0.87 pJ/bit GeSi EAM Driver in 55 nm SiGe BiCMOS. In European Conference on Optical Communication, ECOC 2018, Rome, Italy, September 23-27, 2018. pages 1-3, IEEE, 2018. [doi]
@inproceedings{RamonLVVSHCOYB18,
title = {70 Gb/s 0.87 pJ/bit GeSi EAM Driver in 55 nm SiGe BiCMOS},
author = {Hannes Ramon and Joris Lambrecht and Jochem Verbist and Michael Vanhoecke and Srinivasan Ashwyn Srinivasan and Peter De Heyn and Joris Van Campenhout and Peter Ossieur and Xin Yin and Johan Bauwelinck},
year = {2018},
doi = {10.1109/ECOC.2018.8535467},
url = {https://doi.org/10.1109/ECOC.2018.8535467},
researchr = {https://researchr.org/publication/RamonLVVSHCOYB18},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {European Conference on Optical Communication, ECOC 2018, Rome, Italy, September 23-27, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4862-9},
}