Spiral scanning of atomic force microscope for faster imaging

M. S. Rana, Hemanshu Roy Pota, Ian R. Petersen, Habibullah. Spiral scanning of atomic force microscope for faster imaging. In Proceedings of the 52nd IEEE Conference on Decision and Control, CDC 2013, December 10-13, 2013, Firenze, Italy. pages 354-359, IEEE, 2013. [doi]

@inproceedings{RanaPPH13-0,
  title = {Spiral scanning of atomic force microscope for faster imaging},
  author = {M. S. Rana and Hemanshu Roy Pota and Ian R. Petersen and Habibullah},
  year = {2013},
  doi = {10.1109/CDC.2013.6759907},
  url = {http://dx.doi.org/10.1109/CDC.2013.6759907},
  researchr = {https://researchr.org/publication/RanaPPH13-0},
  cites = {0},
  citedby = {0},
  pages = {354-359},
  booktitle = {Proceedings of the 52nd IEEE Conference on Decision and Control, CDC 2013, December 10-13, 2013, Firenze, Italy},
  publisher = {IEEE},
  isbn = {978-1-4673-5714-2},
}