Rosario Rao, Fernanda Irrera. Threshold voltage instability in high-k based flash memories. Microelectronics Reliability, 50(9-11):1273-1277, 2010. [doi]
@article{RaoI10,
title = {Threshold voltage instability in high-k based flash memories},
author = {Rosario Rao and Fernanda Irrera},
year = {2010},
doi = {10.1016/j.microrel.2010.07.043},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.043},
tags = {rule-based},
researchr = {https://researchr.org/publication/RaoI10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1273-1277},
}